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Single-scale spectroscopy of structurally colored butterflies : measurements of quantified reflectance and transmittanceYOSHIOKA, Shinya; KINOSHITA, Shuichi.Journal of the Optical Society of America. A, Optics, image science, and vision (Print). 2006, Vol 23, Num 1, pp 134-141, issn 1084-7529, 8 p.Article

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Recovery of spectral features readout with frequency-chirped laser fieldsTIEJUN CHANG; MINGZHEN TIAN; MOHAN, R. Krishna et al.Optics letters. 2005, Vol 30, Num 10, pp 1129-1131, issn 0146-9592, 3 p.Article

Precision measurement of the refractive index of air with frequency combsZHANG, J; LU, Z. H; WANG, L. J et al.Optics letters. 2005, Vol 30, Num 24, pp 3314-3316, issn 0146-9592, 3 p.Article

Measurement of grain-wall contact forces in a granular bed using frequency-scanning interferometryOSMAN, M. S; HUNTLEY, J. M; WILDMAN, R. D et al.Optics and lasers in engineering. 2005, Vol 43, Num 7, pp 752-766, issn 0143-8166, 15 p.Conference Paper

Least-squares fitting of wavefront using rational functionNOVAK, J; MIKS, A.Optics and lasers in engineering. 2005, Vol 43, Num 7, pp 776-787, issn 0143-8166, 12 p.Conference Paper

Optimal use of dynamic range of a white light video measurement systemQUAN, C; TAY, C. J; WU, T et al.Optics communications. 2004, Vol 237, Num 4-6, pp 243-250, issn 0030-4018, 8 p.Article

Use of reflection dynamic gratings for studying films and absorbing mediaIVAKIN, E. V; GANJALI, M; SUKHODOLOV, A. V et al.Quantum electronics (Woodbury). 2004, Vol 34, Num 3, pp 294-298, issn 1063-7818, 5 p.Article

High-precision measurement of free spectral range of etalonGEE, S; OZHARAR, S; QUINLAN, F et al.Electronics Letters. 2006, Vol 42, Num 12, pp 715-716, issn 0013-5194, 2 p.Article

Single-shot measurement of the electric field of optical waveforms by use of time magnification and heterodyningDORRER, Christophe.Optics letters. 2006, Vol 31, Num 4, pp 540-542, issn 0146-9592, 3 p.Article

Fringe analysisMOORE, Andrew.Optics and lasers in engineering. 2005, Vol 43, Num 7, issn 0143-8166, 96 p.Conference Proceedings

Absolute fringe order calculation using optimised multi-frequency selection in full-field profilometryTOWERS, C. E; TOWERS, D. P; JONES, J. D. C et al.Optics and lasers in engineering. 2005, Vol 43, Num 7, pp 788-800, issn 0143-8166, 13 p.Conference Paper

Reconstructing surface profiles from curvature measurementsELSTER, Clemens; GERHARDT, Joachim; THOMSEN-SCHMIDT, Peter et al.Optik (Stuttgart). 2002, Vol 113, Num 4, pp 154-158, issn 0030-4026Article

Tech tips : How do you measure UV ?HENKE, G.Materials evaluation. 1997, Vol 55, Num 9, issn 0025-5327, p. 986Article

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Carrier phase component removal : a generalized least-squares approachLUJIE CHEN; CHO JUI TAY.Journal of the Optical Society of America. A, Optics, image science, and vision (Print). 2006, Vol 23, Num 2, pp 435-443, issn 1084-7529, 9 p.Article

Complete characterization of periodic optical sources by use of sampled test-plus-reference interferometryDORRER, Christophe.Optics letters. 2005, Vol 30, Num 15, pp 2022-2024, issn 0146-9592, 3 p.Article

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The new circular polariscope and the Senarmont setup with electro-optic modulation for measuring the optical linear birefringent media propertiesLO, Y. L; LEE, S. Y; LIN, J. F et al.Optics communications. 2004, Vol 237, Num 4-6, pp 267-273, issn 0030-4018, 7 p.Article

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Fringe projection profilometry with nonparallel illumination : a least-squares approachLUJIE CHEN; CHENGGEN QUAN.Optics letters. 2005, Vol 30, Num 16, pp 2101-2103, issn 0146-9592, 3 p.Article

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Backside failure analysis of GaAs MMIC ASICsBEAUDOIN, F; CARISETTI, D; CLEMENT, J. C et al.EPJ. Applied physics (Print). 2004, Vol 27, Num 1-3, pp 475-477, issn 1286-0042, 3 p.Conference Paper